M2000V Variable Angle Spectroscopic Ellipsometer

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The elipsometer is a non-contacting, non-destructive measurement tool which measures the thickness and refractive index of semi-transparent thin films.
• Equipped with a PC for controlling the measurement and statistical analysis software for data fitting and confidence calculations.
• Two lasers perform measurements at over 580 wavelengths in the 370nm to 1700nm range.
• Focus down to a 150 micron spot for measurement.