Leaders in Learning: Publications of Faculty & Staff

The University of Western Ontario


Materials Engineering: 1995-1996

 

LANDHEER, D.

Huang, L.J., W.M. Lau, H.T. Tang, W.N. Lennard, I.V. Mitchell, D. Landheer, J.-M. Baribeau, and S. Ingrey. 1996. Structure of the SiNx/GaAs (110) interface modified with ultrathin Si and sulfur passivation. Journal of Vacuum Science & Technology, B: Microelectronics Processing and Phenomena 14 (4): 2895-2900.

Kwok, R.W.M., G. Jin, B.K.L. So, K.C. Hui, L.J. Huang, W.M. Lau, C.C. Hse, and D. Landheer. 1995. Sulfide-assisted reordering at the InP surface and SiNx/InP interface. Journal of Vacuum Science & Technology, A: Vacuum, Surfaces, and Films 13 (3): 652-657.

Xia, H., W.N. Lennard, L.J. Huang, W.M. Lau, J.-M. Baribeau, and D. Landheer. 1996. Sulphur diffusion at the Si/GaAs(110) Interface. Journal of Applied Physics 80 (8): 4354-4357.

Xia, H., W.N. Lennard, G.R. Massoumi, J.J.J. van Eck, L.J. Huang, W.M. Lau, and D. Landheer. 1995. Absolute coverage measurements on sulphur-passivated GaAs(100). Surface Science 324: 159-168.

 

LAU, W.M.

Huang, L.J., W.M. Lau, I.V. Mitchell, H.T. Tang, and W.N. Lennard. 1995. Characterization of Si(100) sputtered with low energy argon. NIM B: Nuclear Instruments and Methods in Physics Research B 106 (B): 34-37.

Huang, L.J., W.M. Lau, H.T. Tang, W.N. Lennard, I.V. Mitchell, D. Landheer, J.-M. Baribeau, and S. Ingrey. 1996. Structure of the SiNx/GaAs (110) interface modified with ultrathin Si and sulfur passivation. Journal of Vacuum Science & Technology, B: Microelectronics Processing and Phenomena 14 (4): 2895-2900.

Huang, M.B., L.J. Huang, I.V. Mitchell, W.N. Lennard, W.M. Lau, and J.P. Nöel. 1995. Boron depth profiling in a d-doped Si layer. NIM B: Nuclear Instruments and Methods in Physics Research B 100 (B): 149-154.

Kwok, R.W.M., G. Jin, B.K.L. So, K.C. Hui, L.J. Huang, W.M. Lau, C.C. Hse, and D. Landheer. 1995. Sulfide-assisted reordering at the InP surface and SiNx/InP interface. Journal of Vacuum Science & Technology, A: Vacuum, Surfaces, and Films 13 (3): 652-657.

Kwok, R.W.M., and W.M. Lau. 1995. Surface Charge Spectroscopy and Its Applications. Progress in Surface Science 50 (1-4): 357-376.

So, B.K.L., R.W.M. Kwok, G. Jin, G.Y. Cao, K.C. Hui, L.J. Huang, W.M. Lau, and S.P. Wong. May 1996. Reordering at the gas-phase polysulfide passivated GaAs(110) surface. Journal of Vacuum Science & Technology, A: Vacuum, Surfaces, and Films 14 (3): 935-940.

Xia, H., W.N. Lennard, L.J. Huang, W.M. Lau, J.-M. Baribeau, and D. Landheer. 1996. Sulphur diffusion at the Si/GaAs(110) Interface. Journal of Applied Physics 80 (8): 4354-4357.

Xia, H., W.N. Lennard, G.R. Massoumi, J.J.J. van Eck, L.J. Huang, W.M. Lau, and D. Landheer. 1995. Absolute coverage measurements on sulphur-passivated GaAs(100). Surface Science 324: 159-168.

 

SHEASBY, J.S.

Fuller, M., M. Kasrai, J.S. Sheasby, and G.M. Bancroft. 1995. X-ray absorption spectroscopy of antiwear films on aluminum alloys generated from zinc dialkyldithiophosphate. Tribology Letters 1: 367-378.

Sheasby, J.S., and T.A. Caughlin. 1995. The direct observation of the anti-wear action of ZDDP. Lubricants and Lubrication. D. Dowson, et al. Elsevier Science B.V. 399-408. Tribology Series 30.

Sheasby, J.S., and T.A. Caughlin. 1995. Direct observation of the boundary lubrication of ceramics. Advanced Ceramics for Structural and Tribological Applications. 34th Annual Conference of Metallurgists of CIM. Vancouver, BC: 20 August 1995-24 August 1995. H.M. Hawthorne, and T. Troczynski. 243-252.

Sheasby, J.S., T.A. Caughlin, and W.A. Mackwood. 1996. A comparison of the boundary lubrication of 52100 steel, zirconia and silicon nitride by S, P, S/P, and zinc dialkyl dithiophosphate additives. Wear 196: 100-109.

Sheasby, J.S., T.A. Caughlin, S. Terranova, and A. Cohen. 1996. An examination of additive debris to give insight into boundary lubrication. The Third Body Concept. D. Dowson, et al. Elsevier Science B.V. 685-693. Tribology Series 31.

 

SHINOZAKI, D.M.

Herbert, S., D.M. Shinozaki, and R.J. Collacott. 1996. Fine-scale morphology of ultraviolet-ozone etched polyethylene. Journal of Materials Science 31: 4655-4661.

Shinozaki, D.M., and P.C. Cheng. 1996. Soft X-ray image storage in poly(methylmethacrylate). Journal of Materials Science 31: 192-198.

Shinozaki, D.M., and Y. Lu. 1996. On the Measurement of Viscoelastic Properties in Polymers using Microindentation. ICCE /3: Third International Conference on Composites Engineering. New Orleans, LA: 21 July 1996-26 July 1996. D. Hui. 759-760.