Medium Energy Ion Scattering

 

 

Information

  • Ion beams are provided by the 1.7 MV Tandem Accelerator.
  • The UHV chamber contains a VG six-axis sample manipulator (three translation and three rotation).
  • The MEIS technique is based on the use of a TEA (toroidal energy analyzer) with an energy resolution (deltaE/E) of 0.003.
  • The position sensitive detector accepts ions scattered over a range of up to 30° with a precision of 0.2°.
  • A spectrum of scattering events versus scattered energy and angle is collected in this experiment..
  • Double alignment of incident and scattered ions with the crystal lattice allows high resolution measurement of the near surface structure.
  • Also installed in this chamber are a neutral particle detector, RBS detector and an ERD detector with selectable stopping foils.

 

 

Images

MEIS Chamber

 

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